HAMAMATSU OBIRCH
「HAMAMATSU OBIRCH」熱門搜尋資訊
「HAMAMATSU OBIRCH」文章包含有：「DualPHEMOS」、「EMMI微光显微镜(滨松)百科」、「Failureanalysissystem」、「OBIRCH」、「PHEMOS」、「PHEMOS」、「【HAMAMATSU】PHEMOS」、「【Hamamatsu】高解析度微光顯微鏡」、「雷射致阻值變化偵測(OBIRCH)」
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Dual PHEMOS
https://www.hamamatsu.com
IR-OBIRCH (InfraRed Optical Beam Induced Resistance. CHange) analysis detects current alteration caused by leakage current paths and contact area resistance.
EMMI微光显微镜(滨松)百科
http://www.sikcn.com
HAMAMATSU 日本滨松EMMI/OBIRCH微光显微镜PHEMOS系列 ... 简要描述：PHEMOS-1000 是一款高分辨率微光显微镜，它能通过探测半导体器件缺陷导致发射的微弱光和热来定位失效位置。
Failure analysis system
https://www.hamamatsu.com
A high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused ...
OBIRCH
https://www.msscorps.com
汎銓科技OBIRCH設備量充足，提供您迅速有效之分析服務！ Hamamatsu uAMOS-200. OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is ...
PHEMOS
https://seltokphotonics.com
Reflected images and OBIRCH images are obtained, and then both images are superimposed. The laser scan system obtains clear, high-contrast pattern images by.
PHEMOS
https://www.hamamatsu.com
Features · Two ultra-high sensitivity cameras are mountable · Up to 7 light sources for OBIRCH, DALS, EOP and laser marker are mountable · High accuracy stage ...
【HAMAMATSU 】PHEMOS
https://www.spirox.com.tw
HAMAMATSU為客戶提供EFA失效分析領域的缺陷定位解決方案，開發的微光顯微鏡是業界主流的高解析度熱點定位設備，且擁有多項專利產品。設備具備Thermal，EMMI，OBIRCH等分析功能 ...
【Hamamatsu】高解析度微光顯微鏡
https://www.spirox.com.tw
HAMAMATSU為客戶提供EFA失效分析領域的缺陷定位解決方案，開發的微光顯微鏡是業界主流的高解析度熱點定位設備，且擁有多項專利產品。設備具備Thermal，EMMI，OBIRCH等分析功能 ...
雷射致阻值變化偵測(OBIRCH)
https://www.matek.com
IR-OBIRCH 的全名為InfraRed Optical Beam Induced Resistance Change，顧名思義為雷射光束引生的電阻變化異常檢驗，其原理是利用波長為1340nm 的雷射掃描IC，造成掃描點 ...